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Ion beam scattering: Compositional and structural analysis of low dimension structures : Ion Beam Analysis Involves sending high energy ion beams (1-2 MeV) into targets, with Rutherford BackScattering (RBS) detecting the scattered ions while Elastic Recoil Detection (ERD) detects the sputtered (knocked-out) target atoms.
Silicon light emission for photonic devices : Several groups including our team have shown in 2001 that it is possible to obtain a strong improvement of the radiative efficiency of silicon at room temperature by introducing defects by ion implantation.


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