More ...
Ion beam scattering: Compositional and structural analysis of low dimension structures : Ion Beam Analysis Involves sending high energy ion beams (1-2 MeV) into targets, with Rutherford BackScattering (RBS) detecting the scattered ions while Elastic Recoil Detection (ERD) detects the sputtered (knocked-out) target atoms. The two types of analysis are experimentally set up ... More »
Silicon light emission for photonic devices : Several groups including our team have shown in 2001 that it is possible to obtain a strong improvement of the radiative efficiency of silicon at room temperature by introducing defects by ion implantation. These results have boosted research activities aiming at the fabrication of an efficient Si ... More »

 

Retour en haut