Characterization of nanostructures using synchrotron facilities

GISAXS Pattern of [1000] planes of AAO using nanoimprint lithography

Experimental setup

In order to characterize the organization of nanoporous alumina structure or silicon nanowires super lattices, we often use synchrotron facilities (ESRF, Soleil). GISAXS characterization (Grazing Incidence Small-Angle Scattering) allows observing lattice and form factor of nanostructures. We also worked with CNRS/LTM on co-polymer in order to understand mechanisms of organization during temperature or solvent annealing. Moreover, this route enables to exhibit facets of silicon nanowires.


Uniaxial strain mapping measured by micro-LAUE diffraction

Last update : 10/11 2016 (1199)


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